- Pickering Interfaces Inc.
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PXI 1A Fault Insertion Switch 11-Channel
40-195-101
The 40-195 is a 22 Channel Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions on pairs of signals between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Relays ...show more -
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RELIABILITY BOARD (Reliability Test Board)
The reliability test board is used for testing of HAST, THB, HTOL, BURN-IN, etc. It is a product that evaluates the environmental test and durability when applied to actual products such as lifetime test, high temperature, low temperature, high humidity and thermal shock
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Lighting Reliability
LED/OLED package lifetime is highly dependent on thermal management, and LED lamp performance can be dependent on the luminaire in which it is installed. Lighting reliability test system for LED/OLED Products are widely used for normal /accelerated aging, lumen maintenance measuring, lifetime evaluation and temperature characteristic testing for LED/OLED products including LED package, array, module, OLED module and luminaires.
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Reliability Solutions
RT-300
RT-300 is a customizable ecosystem of connected insights, which empower plants and teams to proactively identify maintenance needs, make smarter decisions and keep machine performance and profitability at optimum levels.
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Reliability Testing
ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse va...show more -
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Reliability And Durability Testing
Underwriters Laboratories Inc.
Our reliability and durability testing services provide an accurate assessment of how your product may perform under expected and unusual use. We can help you meet regulatory requirements, gain actionable knowledge about the anticipated life cycle of your products and identify design flaws that have adverse effects on a product’s reliability and durability.
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Reliability & Enviromental Testing
NCEE Labs has been providing industry-standard reliability and environmental testing for 20 years. Our experienced testing staff can assist you in determining the type or level of reliability/environmental testing you require for your products!
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Reliability Testing Services
Innovative Circuits Engineering, inc
Our Reliability Testing Services make it possible for us to work with many different customers who manufacture devices that need tests such as pressure pot, temp cycle and more.The focus of our reliability testing lab is to provide our customers with an array of services and tests that fulfill all of their reliability testing needs. Whether you need preconditioning, thermal shock, pressure pot, or many other reliability testing needs, we are happy to be of service.
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Established Reliability & Military Relays
Established Reliability & Military Relays by Teledyne Relay
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Reliability & Qualification Testing Services
Integra Technologies is an industry leader in providing qualification, design verification and reliability testing services to semiconductor manufacturers and military/space/aerospace and automotive OEMs. Integra offers a full range of qualification services as well as the technical guidance to define a qualification plan that meets your requirements.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Combined Environmental Reliability Test System
VTC SERIES
HALT/HASS testing challenges the design, components, sub-assemblies and final assemblies of today's manufactured products. Stresses are applied through a number of conditions to set operational limits and ultimately precipitate failure in the HALT/HASS test environment. Rapid thermal change rate is one of the classic conditions that facilitate product stress.VTC Series chambers are equipped with an LN2 cooling system, with modulating valve and directed air flow to the product, provides the rapid...show more -
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MBP Reliability Module MOSRA - TMI
W8614EP
The W8614EP Model Builder Program (MBP)Reliability Module MOSRA - TMI includes the extraction package for MOS Reliability Analysis (MOSRA) and the TSMC Model Interface (TMI) aging model.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Radiation Hardened Solutions and High Reliability Components
Offering a complete portfolio of RadHard and HiRel components, CAES serves as the foundation on which many critical applications are built.
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Laser Calibration System, Superior Accuracy, Portability and Reliability
5530
The configurable system offers all the components you need to perform a variety of measurements using the USB on your PC as the host controller and power source. For basic linear measurements you will need the USB Axis Module, USB Sensor Hub, Air and Material Sensors, Sensor Cables, Software, Laser, Laser Cable, Remote Control (optional)and the Linear Optics Set. Other available options include the Laser Tripod (with laser mounting plate), optics and fixturing kits for making additional types of measurements, and wheeled transit cases.
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Modular Power Supplies With High Efficiency And High Reliability
UltiMod Series
The industry-proven Excelsys UltiMod power-supply platform combines technical performance with user flexibility. Built for various demanding industries, the series delivers up to 1200 W of output power in a compact 1U form factor and up to 12 isolated output voltages.
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DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Thin Film Chip Resistors, High Reliability Type
Panasonic Industrial Devices Sales Company of America
An AEC-Q200 Compliant SeriesPanasonic components specified as AEC-Q200 Compliant are consistently designed into automotive systems. However, today’s Design Engineers are specifying AEC-Q200 components to meet the high-quality standards of devices beyond automotive applications.
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RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Enabling Low Power, High Reliability, And High Performance Design
Lattice Nexus Platform
The Lattice Nexus FPGA platform combines Lattice’s long-standing low power FPGA expertise with leading 28nm FD-SOI semiconductor manufacturing technology. With this platform, Lattice enables the rapid development of multiple device families that deliver low power, high performance, high reliability and small form factor.
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Thin Film Chip Resistors, High Stability and Reliability Type
ERA-XV/ERA-XK Series
Panasonic Industrial Devices Sales Company of America
Anti-Sulfurated Thin Film Chip Resistors From Panasonic For Dependable, Accurate And Reliable Performance In Extremely Hazardous EnvironmentsPanasonic's ERA-xV and ERA-xK Series Thin Film Chip Resistors feature a soft terminal and passivated layer. With a total of 2,889 part number variants, Panasonic ERA-xV and ERA-xK Series Resistors provide design engineers with a wide array of Resistors to choose from specifically developed to handle extremely hazardous and challenging application environments.
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Goniophotometers
Instrument Systems Optische Messtechnik GmbH
All goniophotometers are designed as Type C with a horizontal alignment of the optical axis (turning luminaire configuration). Each goniometer sets benchmarks in its class for precision, reliability and handling. If these goniophotometers are combined with a spectroradiometer from Instrument Systems, they are able to determine not only photometric data but also spectral quantities, such as color coordinates, color temperature, and even color rendering index as a function of angle.
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GO-SCAN
15 10 XR
Featuring Teledyne DALSA’s high-resolution CMOS detector, and the lightest x-ray generator on the market, Teledyne ICM’s CPSERIES, the Go-Scan solution is without a doubt the all-around NDT solution when it comes to image quality, ease of use, handiness, and reliability.
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GPIB Cable, 0.5 Meter
10833D
The Keysight 10833D (0.5 meter) GPIB cable is engineered for exceptional reliability and durability even under the harshest conditions. When you buy Keysight GPIB cables, you can be sure of automatic, seamless compatibility between computers and instruments throughout your system. GPIB interface cables, cards, and software for your computers make it easy for you to access and control instruments and exchange data - and it all starts with the cables to connect your computer and instrument. Keysight GPIB cables are fully compatible with the IEEE 44.1 mechanical specification.
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GPIB Cable, 1 Meter
10833A
The Keysight 10833A (1 meter) GPIB cable is engineered for exceptional reliability and durability even under the harshest conditions. When you buy Keysight GPIB cables, you can be sure of automatic, seamless compatibility between computers and instruments throughout your system. GPIB interface cables, cards, and software for your computers make it easy for you to access and control instruments and exchange data - and it all starts with the cables to connect your computer and instrument. Keysight GPIB cables are fully compatible with the IEEE 488.1 mechanical specification.
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GPIB Cable, 2 Meter
10833B
The Keysight 10833B (2 meter) GPIB cable is engineered for exceptional reliability and durability even under the harshest conditions. When you buy Keysight GPIB cables, you can be sure of automatic, seamless compatibility between computers and instruments throughout your system. GPIB interface cables, cards, and software for your computers make it easy for you to access and control instruments and exchange data - and it all starts with the cables to connect your computer and instrument. Keysight GPIB cables are fully compatible with the IEEE 488.1 mechanical specification.
