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- Virginia Panel Corporation
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ITA, I2 Micro ICon, 168 Position, With Oversized Backshell
410130106
The i2 Micro iCon ITA with oversized cable clamp is capable of holding up to 168 QuadraPaddle contacts. With a wider 1.97” footprint, it is ideal for applications requiring shielded twisted pair wiring or other wire types with oversized jackets. The 30-degree u-shaped cable clamp allows ITA modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 1.80". The removable cover allows easy access to wiring for maintenance and probing. Integrated spring locking tabs ensure even and secure engagement.
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Probing Solutions
High Power Pulse Instruments GmbH
Probing Solutions and Probe Arms by HPPI GmbH
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Probing Machines
Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.
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Probing Solutions
ES62X-CMPS
The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Probing Adaptors
Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.
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Vacuum Probing Systems
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
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Laser Probing Tool
InfraScan™ LTM
Checkpoint Technologies' laser probing tool, the InfraScan LTM (Laster Timing Tool), employs a cw laser to optically probe circuit node to produce electronic waveforms. Checkpoint Technologies' stabilized laser source and optical-to-electronic conversion module provides high bandwidth optical probing up to 12 GHz. The LTM can be integrated into an existing InfraScan product such as an INV or TDE or installed as a stand alone system.
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Stack Probing Sensor
L722
The Model L722 Stack Probing Sensor coupled with the L612 Digital Recording Moisture Meter makes it easy to reach deep into stickered units of lumber and take accurate moisture readings without the danger of broken pins. Wagner''s electromagnetic wave technology makes it possible to take multiple readings throughout an entire stack in just minutes.
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Probing & Analysis Adapters
No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Probing, Monitoring & Setting
Marposs offers solutions and equipment that make your machine tool an instrument of unprecedented precision, productivity and reliability. Touch probes and laser-based tool setters hold the cutting process accuracy in check. Our balancing actuators and many dedicated sensors guarantee that your machine tool's functional processes never deviate from their specified set points.
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Magnetic Probing Systems
MPS-C-300 and MPS-C-350
MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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Wafer Probing Machine
UF3000EX-e
Wafer Probe Station is used in connection with test system in Wafer Test process.It is a device to move wafer automatically to examine fair quality of individual chip on the wafer. Probe Station is seperated depending on purpose. For analysis, for mass production as well as manual, semi-automatic, full-automatic.
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Auxiliary Equipment For Probing Machines
We have a lineup of products that support the probing process.
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Portable Manual Probing Station
Model W4.0 x L6.5
This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.
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Robotic Probing of Circuit Cards
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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CMM Contact Measurement (Probing)
A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.
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Topside Probing In-Circuit Test Fixtures
Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.Today’s fifth generation Pneumatic drive supports as many as 8,000 test probes with centerline spacing to 25mil, and contacting test pads as small as 0.014″.
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Topside Probing for Functional Test Fixtures
Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Clamshell Fixtures (Top Side Probing)
Clamshell fixtures are used to test circuit boards from both the top and bottom sides simultaneously. Arcadia offers various assemblies to accommodate this. Whether you require vacuum, pneumatics, or mechanically actuated Z motion lids, we have numerous sizes available from off our shelf inventory to meet every need.
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High Power Probe System Solutions
MPI Advanced Semiconductor Test
MPI high power probing solutions offer variety of probing systems which include manual, automated and fully-automated versions to provide solution for different budgets and specific requirements.
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Complete Probe Station
BD Series
Best for DC and RF probing, the platen lift is designed for smooth raise and contact of your probes simultaneously to your device. It is ideal for probing multiple spots on your device, or through multiple devices.
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Inline Micropositioner
SP-150
Signatone's most stable and precise micropositioner for sub-micron probing.
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InfiniiMax Probe, 7 GHz
1134B
Use for high-speed differential or single-ended probing in embedded designs
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Sampling Scope Adapter
N5477A
The N5477A sampling scope adapter makes the InfiniiMax III probing system fully compatible with the Infiniium 86100 DCA sampling scope family. With the N5477A, the DCA modules have 30 GHz of probing, increasing their performance and flexibility.
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Controlled Environment Probe Station
CG-196
Everbeing controlled environment probe station allows vacuum and cryogenic probing down to 77K with liquid nitrogen or high temperature probing up to 1273K. Efficient in characterizing your devices at extreme temperatures, vacuum, specific gas, etc.
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Micropositioner
MP-40
Engineered for highly demanding probing needs, the Korima Model MP-40 Micropositioner is precision-built for micropositioning to meet ever smaller industry standards. Featuring linear motion on all three axes, the MP-40 provides precise control for sub-micron probing.
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Micropositioner
MP-80
Engineered for highly demanding probing needs, the Korima Model MP-80 Micropositioner is precision-built for micropositioning to meet ever smaller industry standards. Featuring linear motion on all three axes, the MP-80 provides precise control for sub-micron probing.
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Micropositioner
Our broad range of micropositioners fill requirements for probing for different measurement applications as well as measurement environments. For example, a measurement system focused on cryogenic environments would not use the same product for room temperature probing. Likewise, a DC micropositioner is unfit for mmW measurement applications.
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Machine Tool Probes and Software
Probing is an established best practice for maximising the efficiency, quality, capability and accuracy of machine tools. Standard routines built into modern CNC controls simplify the integration of probing cycles into machining operations and offline tools. These routines, combined with a CAD interface, make the simulation of measurement functions easy.
