Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
- Virginia Panel Corporation
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Module Accessory Kit, Quantity 26 4-40 x .31" Flat Head Phillips Screws 100 Degree
510109371
Used with modules: 510104135.
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Test Head Manipulators
Cobal 250
The Cobal 250 offers the best-in-class range of motion for universal manipulators with seven degrees of motion. Separate linear movements make it easier for the operator to dock, undock, and redock the test head in seconds. In combination with inTEST EMS docking, the Cobal 250 is compatible with testers for both Wafer Sort and Final Test, minimizing the time and cost when moving a tester between Sort and Final Test.
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Mechanical Test Head Housing
a result of more than 10 years' experienceavailable with integrated manipulatorfully integrated docking and board lockingtest housing mechanics design as per customer specificationssuitable for individual and high-volume productionstandard and customized dimensionsno limitation in size and electrical power capacitiesquick and easy locking and unlocking process for board changelarge application space load boardoptional number of channel boards as per customer specificationsfamily/DUT board conne...show more -
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Van der Hoofden Test Head
The "Van der Hoofden“ test head allows to determine the exposure of humans to radiation caused byluminaries.
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Scanning Head For Energy Meter Test
PACB108
PACB08 is the accessory device to perform the energy meter test, which can work together with PONOVO’s relay test sets to test energy meter by using Energy Meter Module in Powertest software.
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Head Expanders
By increasing the mounting area of the shaker, multiple items can be tested at the same time, decreasing total test cycle time. In addition, with Guided Head Expanders, payloads with large foot prints can be safely mounted and tested on the shaker, minimizing the risk of damage to the shaker suspension system. Although many head expanders are resonant below 1000 Hz, average or extremal control allows operation to 2000 Hz.
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Remote Radio Head Test, Reference Solution
The Remote Radio Head Test, Reference Solution provides the physical interfaces together with the vector signal analysis and vector signal generation you need to carry out comprehensive functional and performance testing of your RRH). Fully characterize the uplink and downlink, RF air-interface to and from the digital "front-haul".
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Hydrostatic Head Tester
TF163
TESTEX Testing Equipment Systems Ltd.
Hydrostatic Head Tester, used for determining the resistance of fabrics (canvas, coated fabrics, cover cloth, rainproof clothing fabrics, and geotextile materials) and films to water penetration under pressure while firmly clamped in the test rig of standard area.
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Hydrostatic Head Tester
TESTEX Testing Equipment Systems Ltd.
Hydrostatic Head Tester, used for determining the resistance of fabrics (canvas, coated fabrics, cover cloth, rainproof clothing fabrics and geotextile materials) and films to water penetration under pressure while firmly clamped in the test rig of standard area, by means of dynamic test method and static test method.
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Hydrostatic Head Tester
TESTEX Testing Equipment Systems Ltd.
Hydrostatic Head Tester is used for measures the resistance of a fabric to the penetration of water under hydrostatic pressure. Hydrostatic Head Tester complies with AATCC 127, EN 20811, ISO 1420A, etc. Please contact us for Hydrostatic head test procedure.
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WLCSP Probe Heads
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Hydrostatic Head Pressure Tester
Sataton Instruments Technology CO., Ltd
Hydrostatic head pressure tester is designed to determine the resistance to water penetration of materials by hydrostatic pressure method. By measuring the opposition to the passage of water through the tested specimen, the tester is to provide standard testing conditions for operator to note the test terminal point. The tester is primarily intended for ducks, tarpaulins, tentings, waterproof materials and other materials which are used for impermeable application, such as chemical protective clothing or medical protective clothing.
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Custom Magnetic Recording Heads
International Electro-Magnetics, Inc.
We have manufactured over 5,000 different head designs. If we don't have one to suit your requirements, we will design and build to your specification. Our toolroom is well equipped to produce precision parts, and our design projects have included flux sensing systems, magnetic disk encoding, and electronic test equipment.
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HEAD acoustics Radio Analyzer Tool
TUNE
The HEAD acoustics Radio Analyzer Tool TUNE allows a reproducible analytical evaluation of the impact of analog radio broadcast disturbances on perceived audio quality based on auditory test results.
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Optical Power Meter with Optical Head
GM8012 + 2 X GM8300X
The UC8820 + 2 X UC8820X optical power meter with optical head offer superior performance for the test of DWDM components, AWG & PLC components, optical amplifiers, and other general purpose of fiber optical test and measurement applications. It is special design for volume production line application.
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Remote Radio Head 50 GHz
CMPHEAD50
The R&S®CMPHEAD50 is the only remote radio head supporting bi-directional testing at five mmWave frequency bands with one hardware set and EVM booster ports. It extends the R&S®CMP200 radio communication tester to frequency range 2 (FR2/ FR2-1). The improved performance ensures optimum accuracy for testing next generation FR2 RF designs – from early development to final certification and regulatory compliance. Test with confidence and ensured RF performance with the latest state-of-the-art measurement solution from Rohde&Schwarz.
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Error Detector Remote Head 32 and 17 Gb/s
N4952A
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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In‐Circuit Test Fixtures
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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Emulation & Test Interface
Solder down modules to suit any package type provides a cost effective solution for replacement test heads, male or female. The mating top modules can incorporate either a ZIF or standard IC socket and the addition of optional test pins if required from RS Components.
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Final Test Manipulators
for test heads up to 250 kg / 550 lbsfinal test dedicatedhandler docking prolowest possible floor loadeasy motion in z-direction to facilitate docking processforce feedback control feature ensuring operator safety and protecting equipment during set-upactive cable managementdurable and robust designoptimized footprint for various test heads580 mm linear in/out motion for handler service access160 mm linear side-to-side feature270 column pivoting featurenumerous additional, unique features for individual set-up requirements
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Flying Prober Test
QTOUCH1202C
Qmax Test Technologies Pvt. Ltd.
he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar...show more -
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Functional Test Fixtures
Test Head Engineering's Custom Functional Test Fixtures range from simple to extremely complex. Typically, our customers do their own wiring and programming, but we will complete the job right up to the customer's requirements, including offering turn-key control and test programming through our partners.
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Manual Test Adapter
linear pin compressionhinged carrier for probe cardfacilitated probe tower positioningmounted onto test head stiffener
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell...show more -
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RF/Wireless Test Fixtures
Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
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Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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Becker Transponder Test Fixture
TA-3400
This transponder test fixture is specific to the requirements for testing Becker Avionics Transponders and provides interface connectors for both the panel mount and remote systems. The panel also provides switches to implement Gillham code altitude as well as separate interfaces for an external parallel or serial encoder. The panel will interface with the RMU 5000 or standard control head. This fixture also comes with voltage and current meters along with an internal dimming source. This panel comes in the standard 19 inch rack width and measures 12 inches in depth.
