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Resistance Test
measured in ohms is the ability of a current to conduct.
See Also: Resistance, Resistivity, Resistance Standards, Resistance Meters, Battery Internal Resistance Testers
- Pickering Interfaces Inc.
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PCI High Density Pecision Resistor Card, 9-Channel, 2Ω To 31.5Ω
50-298-110
The 50-298-110 is a high density programmable resistor card with 9 channels which can be set between 2Ω and 31.5Ω with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Resistance Test Systems
QT-3000 Series
Developed for thermal resistance test of Transistor MOSFET IGBT DIODE.
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Winding Resistance Test
20A DC booster
The 20A DC STCS booster allows to perform resistance tests on a PT with a current up to 20 A DC. The option is used together with STS 5000 and STS 4000 and must be connected to STCS module.
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Insulation Resistance Test Instrument
2681
Shenzhen Chuangxin Instruments Co., Ltd.
Insulation Resistance Test Instrument
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Ground/Insulation Resistance Test Series
Wuhan Huatian Electric Power Automation Co., Ltd.
Ground/Insulation Resistance Test Series by HVTEST
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Floor Resistance Test Kit
PMK-152
The PMK-152 Floor Resistance Test Kit contains the instruments you need to take resistance measurements.The PMK-152 includes Prostat's PRS-812 Resistance Meter with 5 pound conductive rubber electrodes. You can take measurements at 10 and 100 volts with accuracy within ±5%.
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Contact Resistance Test Sets
When a high current passes through a pair of mechanically independent metallic contacts, the resistance must be as low as possible. An increase in resistance can lead to additional degradation, as I2R losses will cause local heating of the contact surfaces. Our range of micro-ohmmeters measure both steady state and dynamic low resistance values. With test currents up to 600A available, logging and trending are also available on some models. We ensure that our Contact Resistance tests sets are portable, making them suitable for field measurements. Our contact resistance testers’ portability makes them ideal for a vast range of resistance testing across the entire LV, MV HV and EHV spectrum.
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UV Resistance Test Chamber
The UV Weather resistance test chamber is the world’s most widely used weathering tester to test types of damages include color change, gloss loss, chalking, cracking, crazing, hazing, blistering, strength loss and oxidation.
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Low Resistance Test System
9100-2
Palico Instrument Laboratories
The Model 9100-2 measures the resistance of single or multiple battery separators quickly and accurately when used with our Model 9000-9100 Electrolyte Test Bath. This system uses a 4-terminal measurement technique which cancels the effects of electrode/electrolyte potentials.
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Moisture Resistance/ Humidity Test
This test is performed for evaluating the resistance of component parts and constituent materials to the deteriorative effects of the high-humidity and heat conditions typical of tropical environments. Most tropical degradation results directly or indirectly from absorption of moisture vapor, and from surface wetting. These phenomena produce many types of deterioration, including corrosion of metals; physical distortion and decomposition of organic materials; leaching out of constituent components of materials, and detrimental changes in electrical properties.
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Tire Rolling Resistance Test System
This system measures the rolling resistance of each tire accurately. In addition to the simultaneous measurement of tire loss resistance and rolling resistance coefficient for each drive by mode operation (JC08, WLTC), coasting test, constant acceleration/deceleration test and transient mode test are able to be performed. Furthermore, measurement of driving noise/ vibration of the tire, effect of the tire loss due to the temperature change can be verified by adding options.Conforming the JIS D 4234: 2009 and ISO 28580: 2009.
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Digital Surface Resistance Test Kit
PAS-853BRM
- Surface Resistance Kit from 0.01 ohm to 9.99x1012 ohms- Nominal Full Range Tolerance Averages <±5%- Fully Automatic Resistance Range, Test Voltage and Electrification Period control- Determines if a surface is Dissipative, Conductive, or Insulative- Measures resistance point-to-point(Rtt) and point-to-ground (Rtg)- Measures resistance of Static Control Floors, ESD Work Surfaces and Packaging Material- Conforms to all ESD Association Standards for Resistive Characterization- Includes 2 each Conductive Rubber Electrodes- Packaged in a hard shell Carrying Case- Certificate of Calibration Traceable to NIST included
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Surface Resistance Meter Kit - Test Anti-Static, Static Dissipative and Conductive Surfaces
PRS-812RM
- Surface Resistance Tester from 0.10 Ω to 1 Teraohm- Constant Voltages 10 volts and 100 volts- Automatic Electrification Period- Determines if a surface is Dissipative, Conductive, or Insulative- Measures resistance point-to-point(Rtt) and resistance to ground (Rtg)- Measures resistance of ESD Flooring, ESD Worksurfaces and Packaging- Conforms to all ESD Association Standards for Resistive Characterization- Includes 2 each Surface Resistance Probes- Packaged in a hard shell Carrying Case- Certificate of Calibration Traceable to NIST included- 2-year Limited Warranty on Main Instrument
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SMD Tester Capacitance Resistance Diode Tweezers Test Pen Multimeter SMD Meter
VA503
Shanghai Yi Hua V&A Instrument Co., Ltd. CO.,LTD
SMD tester Capacitance Resistance Diode Tweezers Test Pen Multimeter SMD Meter. SMD Components Identifier
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SMD Tweezer Capacitance Resistance Diode Tweezers Test Pen Multimeter SMD Meter
VA50372
Shanghai Yi Hua V&A Instrument Co., Ltd. CO.,LTD
SMD tweezer Capacitance Resistance Diode Tweezers Test Pen Multimeter SMD Meter VA503 SMD Components Identifier
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
