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- Pickering Interfaces Inc.
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PXI/PXIe Microwave Relay, Quad SPDT, 40 GHz, 50 Ω, SMA-2.9, Failsafe
42-780B-544
The 40-780B-544 (PXI) and 42-780B-544 (PXIe) are quad failsafe SPDT 40 GHz unterminated microwave relay modules. The 40/42-780B range is available with one, two, three or four SPDT switches capable of switching frequencies up to 67 GHz in 50 Ω or 2.5 GHz in 75 Ω. Connections are made via front panel mounted high quality RF coaxial connectors, SMA or N-Type for 50 Ω and 1.6/5.6 in 75 Ω versions. Remote versions are also available which can support up to three SPDT relays in a single slot.
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Protection Relay Test PW636i
PW636i
PW636i universal relay testing equipment is the most powerful protection relay test equipment. It can do all types of protection relay testing, from electromagnetic relays to numeral relays, microprocessor computer relays, and IEC61850 digital relays.
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Protection Relay Test Set
HT-1200 / 305
Wuhan Huatian Electric Power Automation Co., Ltd.
It can be used to test all kinds of traditional relays and protection devices as well as modern microcomputer protection.
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Protection Relay Test Set
HT-802 / 301
Wuhan Huatian Electric Power Automation Co., Ltd.
Special instrument for microcomputer relay protection test of microcomputer industrial control machine.
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Relay Protection Test System
RELAYSTAR 1600
HAOMAI Electric Power Automation Co., LTD.
Relaystar-1600 the 6 phase universal relay protection test kit6-phase current (6×40A) + 6-phase voltage (6×150V) output.
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Relay Protection Test Cabinet
SFJ018
Shanghai Launch Electric Co., Ltd.
SFJ018 relay protection test cabinet uses double carbon brushes regulator, big buttons for regulating AC/DC voltage, current under large loading, small buttons for regulating AC/DC voltage, current under small loading,. The two output channels could work simultaneously. It also take use of digital meters of Grade 0.5, sensor of high accuracy, six digital display stop watch, satisfying requirements for time measurement.
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Protection Relay Test Set
PW41i
PW41i is designed with 3 currents (3*40A) and 4 voltages (4*300V). The local software system with many relay testing modules is designed based on Windows system, which is easy and convenient for operation and upgrade.
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Protection Relay Test Generator
The MIG0603OS2 includes combination wave circuit IEC 61000-4-5. Additionally a 0.5J, 500 Ohm circuit is included in accordance with IEC 60255-5. The two BNC monitor outputs allow monitoring the voltage and current wave shapes by an oscilloscope
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Three-phase Protection Relay Test Set/Kit
POM2-3243
POM2 series protection relay test kit is the best modular designed relay tester with local control system. There are 2 models, the POM2-6143 and POM2-3243, the POM2-3243 with 3×20A and 4×300V.
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Power Calibrator And Protection Relay Test Set
CP11B
Calmet Smart Calibration Devices
Single phase, class 0.02 and 0.05 power quality calibrator up to 120A and 560VAC with programmable power quality parameters. It makes possible to make automatic test of electricity meters, measurement transducers, current transformers and protection relays.
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Stand-alone Three-phase Protection Relay Test Set
Weshine Electric Manufacturing Co., Ltd
Universal Auto Low Price 3 Phase Relay Protection Tester, 3 Channels ,40A/450VA Three-Phase Parallel 120A, 3 Channels, Each Channel ±10A/200VA
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Single Phase Universal Protection Relay Test Set
S100A
S100A is the Universal Single Phase Protection Relay Test Set with 1*100A and 3*150V output, local control system for basic relay testing with manual operation.
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Portable Multi Phase protection relay test set with GPS
TEST-630
Beijing GFUVE Electronics Co.,Ltd.
Test-630 multi Phase Universal protection relay test set have 6U6I output, it is a universal protection relay tester with eight pairs of binary input and four pairs of binary output
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
