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Product
Cell Testing
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PEC offers a wide range of cell testers, starting from the 5A desktop test system (ACT0505), to our range of 50A cell testers for more standardized cycling (CT0550) and our advanced cell testers with capabilities up to 4000A (ACT0550). All systems support parallel switching for achieving higher currents.
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Kelvin Test Contactor
cCompact
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cCompact™ test contactor offers a reduced site-to-site pitch concept enables high parallel test for power applications on strip test and pick and place handler platforms.Featuring compact Kelvin footprint with outstanding CRES stability by Denmark pin material. Automotive temperature range -60°C to +175°C. Integrated Socket Air-distribution.
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Hyperspectral Cameras with USB3 Vision
xiSpec
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*Smallest Hyperspectral camera - Compact, lightweight with only 26.4 x 26.4 x 31 mm, 32 grams (1)*Cost efficient - Excellent value and price through utilizing new imec hyperspectral imaging technology*Cool economy - Low power consumption with 1.6 Watt, minimal heat dissipation, ideal for UAV / UAS*All-around support - USB 3.0 support for Windows 7 and 10, macOS, Linux, ARM*Powerful potential - Highest spatial and spectral resolution, possible with 5Gb/s interface*Optimized - 2048 parallel, "on-chip" integrated spectroscopes with 100 points of spectral resolution each*AIA standard - USB3 Vision standard compliant*Industry standard interface - Compatible with USB 3.0 SuperSpeed specification*Fastest Hyperspectral camera - High speed, high frame rate: based on 170 fps at 2.2 Mpix resolution*Connectivity and Synchronization - Programmable optoisolated input and output, 3 status LEDs*Easy deployment - Range of accessories and wide hardware and software integration*Highly Customizable - Variety of sensor options, which can be further adjusted to match requirements*Interoperability increase - Continuous embrace of new software and hardware partners
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Desktop Meter Test Station
2990
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The 2990 revolutionizes meter testing by providing full series parallel meter testing in a small, budget-friendly desktop package.
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1MP OV10633 Custom Lens Camera Module
e-CAM1M_CU10630_MOD
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e-CAM1M_CU10630_MOD is a High Dynamic Range (HDR), Wide Dynamic Range (WDR), custom lens camera module targeted for surveillance and security applications. This HDR camera module based on the OV10633 sensor from OmniVision is e-con’s first Wide Dynamic Range (WDR) camera module that can stream 1280x720p video at 30fps over its 8-bit digital video parallel interface. This 1MP WDR/HDR camera module is compatible with almost all of the popular Application Processor families such as TI OMAP, TI Sitara, NXP/Freescale i.MX, Marvell Xscale, Samsung etc and also compatible with Digital Signal/Media Processors such as TI OMAP35x, TI DaVinci DM37x, DaVinci DM3xx etc. The camera module is mounted with an industry-standard S-mount M12P0.5 lens holder allowing our customers to choose a lens of their choice.
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Digital Demultiplexers
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Advanced Science and Novel Technology, Co., Inc.
24:48 digital demultiplexer (DMUX) with SSTL1.5 input and output interfaces.Supports data rates from 1.0Mbps to 2.0Gbps.User-controllable independent internal delays for data and clock signals.1.5V I2C control interface with a user-defined 3-bit chip address.Preset function for synchronization of multiple parallel devices.Full-rate output copy of external high-speed clock input signal.Two pairs of clock divided-by-2 and synchronous clock enable outputs for supporting the tree-type demultiplexation structure.Additional synchronous clock divided-by-4 output.Dual power supply of +3.0V and +1.5V.Industrial temperature range.Low power consumption of 2.1W at 2.0Gbps.Available in custom 256-pin BGA package (13mm x 13mm x 2.5mm).
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High voltage Flexible range Regulated DC Power Supplies
PSF-H Series
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* Main Applications: High-voltage capacitors or relays used for hybrid cars, electric cars, solar power system and high-voltage LED lighting equipment.* 6 times of flexible output range: PSF-800H covers output for several units of conventional type regulated power supplies within 800W ( max voltage 800V, max current 6A. ).* Constant Power Control: CP mode is available in addition to CV and CC modes.* Changeable setting style: Vertical or horizontal setting by 90rotating panel.* Sequence Operation: Stand-alone sequence is available with the insidememory programmed by PC, through the optional control board (IF-60GP, IF-60RU).* Master-slave parallel operation: Possible to increase the output current by master-slave parallel connection of the same model (up to 2 units).* Various functions are available: Output OFF timer, 3-point preset memory, Remote sensing, External analog control, OVP/OCP/OHP protections
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Fluid Power Actuators
CQ
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The CQ range provides an innovative fully-concentric and balanced actuator design for quarter-turn valves. The design features a helical mechanism that transforms linear piston motion into quarter-turn valve stem rotation. CQ actuators provide a much higher torque output for a given footprint than scotch yoke designs typically utilised to operate many quarter-turn valve types. It is therefore ideally suited for installation in confined spaces. Further, Rotork’s unique helical pin design provides higher efficiency than a helical gear mechanism utilised by other valve actuator manufacturers.As standard, the CQ torque output profile, like that of a scotch yoke actuator, is engineered to parallel the torque demand profile typically found with popular quarter-turn valve types. The CQ design however is unique in that the torque profile can be custom engineered and manufactured to meet specific, non-standard valve torque requirements.In our experience, the CQ standard range of sizes is suitable for applications that require a pneumatically powered actuator with torque demand less than 150,000 Nm. However, we also engineer CQ actuators with greater output and/or hydraulic power. Please apply to Rotork for these applications.
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CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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96-CH High-Driving DIO Card
PCI-7396
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The PCI-7396 is 96-bit parallel digital input/output (DIO) cards designed for industrial applications. The PCI-7396 emulates four 8255 Programmable Peripheral Interface (PPI) chips. Each PPI offers three 8-bit DIO ports which can be accessed simultaneously. The total 12/6 ports can be configured as input or output independently.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Liquid Test Fixture
16452A
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The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Camera Link Translators
CLT-303
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The CLT-303R and CLT-303L Camera Link Translators convert RS-422 & LVDS to Camera Link, enabling the use of cameras incorporating traditional RS-422 and LVDS parallel digital interfaces with Camera Link frame grabbers. The “R” and “L” versions support RS-422 and LVDS cameras, respectively. These Camera Link converters are extremely flexible and can convert a wide range of cameras from parallel digital output to Camera Link base configuration with up-to 24-bit data.
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Crossed Roller Tables(Aluminum & Steel)
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Del-Tron’s crossed roller tables are known for their high accuracy and exceptional load carrying capabilities. Our crossed roller bearings are available in both aluminum and steel, and the perfect choice for applications where these criteria must be met. Accuracies range from 0.0001” per inch of travel straight line accuracy on our aluminum tables to 0.00008” of parallelism on our steel crossed roller tables and are capable of carrying loads in excess of 2600 lbs.
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Logic Analyzer & Protocol Decoder
SP209
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SP209 series logic analyzers and protocol decoders offer in depth analysis of logic signals and protocols with 200MHz (5ns) timing resolution. 9-channel logic analyzer allows 8-bit parallel data to be captured along with a clock or strobe signal.
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NI-9477, 60 V, 32-Channel (Sinking Output), 8 µs C Series Digital Module
779517-01
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60 V, 32-Channel (Sinking Output), 8 µs C Series Digital Module - The NI‑9477 works with industrial logic levels and signals to connect directly to a wide array of industrial relays, solenoids, and motors. Each channel is compatible with signals from 5 V to 60 V and … features isolation from channel‑to‑earth ground. You can wire the NI‑9477 channels in parallel to sink up to 20 A of current per module (1 A per channel maximum).
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Dielectric Material Test Fixture
16453A
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The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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GPGPU Cards
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Curtiss-Wright Defense Solutions
For applications requiring massive parallel compute capability, such as deep learning frameworks for AI applications, our highly engineered GPGPU co-processing engines provide a field-proven hardware foundation. Curtiss-Wright GPGPU co-processing engines leverage the latest NVIDIA Tensor Cores (for machine learning) technology and are a critical component of the high-performance embedded computing (HPEC) ecosystem that delivers data center capability at the tactical edge.
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Variable Resistor Load Bank
REOLOAD 100
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A variable resistor load-bank with fixed stages connected in parallel and switched in, as required, with an adjustable stage for fine trimming. Designed for testing equipment under load. 1000V (AC or DC). 250A and 2500
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Automatic Span Gasgenerator Unit
ASGU-370 Series
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The multi point calibration units ASGU-370 series is designed for simultaneous (parallel) or step by step (serial) checking of gas analyzers. It is primarily installed in laboratories for quality assurance and is also used for the production of gas analyzers.Furthermore are the calibration units as a Transfer standard in portable suitcase available. Here we have for ongoing quality control in field the versions all in one aluminum suitcase and for a flexible and back-friendly wearing comfort the ASGU-370TS SPLIT.
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Pattern Generator
PI-2005
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As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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True Phase Identification System
SPI-III™
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Our vision has always been to create a phase identification system that exceeds any of today’s industry quality, safety and efficiency requirements. SPI-III’s unique design consists of a wireless bi-module combo that is stunningly easy to configure and operate. With many advancements and innovations, SPI-III will be more helpful than ever before, enabling field applications such as identification of A-B-C electrical phases from all 50 and 60 Hz networks, switchgear phase concordance (matching), phase rotation, system paralleling, underground phasing applications and more.
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DC Power Supply
PW-3063R
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*Use Toroidal Transformer. Low EMI & High EMS.*Triple output, 0-32V/0-6A X2 and 5V/3A .Max. 400Watts*Tracking operation. Max. output 64V/6A on tracking series or 32V/12A on tracking parallel.*4 display, Green LED shows Voltage and Red LRD shows Current. Easy to read.*Compact design. G.W. 9Kgs only. Easy to handle.*The resolution of PW-3063R as high as 0.1v and 0.01A.*Very low Ripple & Noise, less than 0.4mVrms. Very suit for precise measurement.
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Holographic Concave Gratings - Type I
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type I holographic concave gratings are recorded on spherical substrates, with equidistant and parallel grooves.Their geometric optical properties are the same as classically ruled gratings and are interchangeable with them.When used in a spectrograph, Type I holographic concave gratings are traditionally arranged on the Rowland circle (i.e., the circle defined by the grating center and the tangential radius of curvature of the grating).
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Dielectric Test Fixture
16451B
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The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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PXI Source Measure Unit
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PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility. These features include high channel density for building parallel SMU test systems, deterministic hardware sequencing for minimizing software overhead, and high-speed update and sample rates for quickly changing setpoints and acquiring data. Additionally, the flexible sampling rate and streaming capability of PXI SMUs allows you to use the instrument as a digitizer to capture transient behavior, and the digital control loop gives you the ability to adjust the transient response of the instrument. The ability to change the transient behavior of the SMU, called SourceAdapt, reduces SMU settling time and minimizes overshoot and oscillations, even with highly capacitive loads.
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AMR Angle Sensors
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MultiDimension Technology Co.,Ltd.
Iis proportional to the sine or cosine functions of two times of the angle – sin(2α) and cos(2α) – of a magnetic field applied parallel to the surface of the sensor, which can be provided by a small magnet positioned above the device.
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VLSI Test System
3380
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The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Full Wafer Contact Test System
Fox 1
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Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
