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- Optomistic Products
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Universal LightProbe Sensors
Optomistic Products’ unique Two-Part Solution fulfills almost every LED test requirement you may have.First, determine your test requirements. For example: LED color and intensity test with an analog output, or, LED ON/OFF status with a digital output, etc. Then, choose from the range of Sensors listed below to address those requirements.
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LED Test
Neosem developed and released the LX500 - LED Accelerated Aging Tester to provide our customers with the capability to deliver highly reliable automotive LED products to the market. By adopting Neosem’s patented temperature control algorithm, the customer can execute the LED device aging test at very stable temperatures.
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LED Test
Universal LightProbe Penta sensors are Optomistic Products' most popular LED test sensor, relied upon for their versatility in accommodating most LED test applications for color and intensity. The Penta Sensor provides analog voltage outputs, and features built-in color binning, eliminating the need to convert LED wavelength to visual color in the ATE software, and saving valuable processing time. For use with any of the Universal LightProbe Fiber-Optic Probes.
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LED Test Instruments
Photobiological Safety of Lamps and Lamp System and IEC TR62471-2(2009) Guidance on Manufacturing Requirements Relating to Non-laser Optical Radiation Safety have be published addressing hazard to human (mostly eye and skin), and are completely suitable to assess the optical radiation safety of non-laser sources, such as LED products, UV radiation in general lighting products and etc.
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LED Burn-In Test
Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.
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LED Test Production System
Lumere-LC
Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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PC Based Test Setup for LED Driver of LED
The tests are Performed as Prescribed in IS the Panel Carries out high voltage, open circuit and performance tests, one by one and provides indication of the Test results as PASS or FAIL lamp for high voltage test. It is very useful and handy in line testing on Mass production line as well as type Testing. Special fixture can be provided for the specific product. This avoids the connections & disconnections of the product for different tests. The total time for entire testing is less than 80 seconds. Micro controller based sequential timer maintains the sequence of operation and displays the test status. The entire system is housed in sturdy M.S cabinet with powder coating.
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High Power LED Test System
Lumere-GM
Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.
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Goniophotometer Test System For Led Lamp
1680A 1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341,the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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Goniophotometer Test System For Led Lamp
LCG-1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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LED Power Driver Test System
Chroma C8000
Chroma Systems Solutions, Inc.
The Chroma 8491 ATS is equipped with optimized standard test items for LED driver testing (lighting & TV backlight). The user is only required to define the test conditions and specifications for the standard test items to perform the test.
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LED Optical Aging Test Instrument
LEDLM-80PL
LEDLM-80PL LED Lumen Maintenance and Aging Life Test System is designed according to standards of IES-LM-80, IES-LM-82, TM-21 and GB2312-80, and the software is developed base on Arrhenius model. LED has the features of long life, but with the different working condition and drive current, its life will be different, but generally the life will be around 50K hours. Differ from the traditional lightsource, LED light will decay gradually rather than extinguish instantly, so in the standard of LM-80, it introduces L70, L50 and etc.
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LED Driver Automatic Test System
ATE-2
•This system includes 2 groups (left and right); the 2 groups can work in turn, so that to improve the work efficiency. For example, if the left is on working, then the right can make wire connection. •It can test 4 LED drivers input and output at one time. •The equipment can connect with electronic load and LED load, the two difference loads can be fast switch under the control of computer. •Enable to print out the series number and parameters of sub-quality products by working with a micro-printer, •Enable to achieve the bar-code record function by working with a bar-code scanner. •The test report can be saved as Excel file for consult, statistic and analysis purpose. •Good software interface to freely choose the difference parameters combination, so that to meet different demands. All the parameters can set limit, and with the quality analysis function.
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SMD LED Aging Test Machine
CX-6100
Shenzhen Chuangxin Instruments Co., Ltd.
Designed to measure the aging-life and color comparisons of 50pcs 5050 SMD LED and 100pcs 3528 SMD LED.• 150 separate constant current supply• Aging functions: constant current, impact pulse, on-off mode• Range of forward voltage(VF): 5.0V• Range of forward current(IF):1) constant current: 0-100.0mA2) Impact pulse: 0-200.0mA• Range of impact pulse frequency: 10-9999Hz; Duty ratio: 1%-99%
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4 + 4 LED Driver Test Panel
SCR Elektroniks make 4+4 LED Driver Test Panel to test the driver one by one.
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LED Test Programmable DC Electronic Load
IT8912E Series
IT8900 series high accuracy LED specific testing electronic loads can simulate the real output of LED lights with different characteristics.Their specific circuit can realize CR-LED mode, adjustable frequency, duty ratio PWM dimming output port (frequency: 20Hz-2KHz), I-pp/I-max measurement function can test current ripple and start up surge current of LED constant flow source. Voltage and current testing speed can reach 50KHz. IT8900 series provides CR-LED / CC / CV + CC / CR /CW and other working modes, built-in USB / RS232 / GPIB communication interface. Widely used in LED driver power dimming test.
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LED Lighting Test Instrument Integrating Sphere
CX-I.5S
Shenzhen Chuangxin Instruments Co., Ltd.
Measure Luminous Flux, Luminous efficacy, radiant power, Spectral Power Distribution, Chromaticity Coordinate, Correlated Color Temperature, Peak Wavelength, Dominant Wavelength, Spectral Half Width, Color Rendering Index, Colorimetric Purity, red ratio, Standard deviation of color matching(SDCM), voltage, current, power, power factor, harmonics, and etc. It meets the requirements of CIE standards.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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PC Based Test Setup for LED PCB of Luminaire
The panel carries out different tests one by one and provides indication of the Test results as OK or NOT-OK. It is very useful and handy in line testing on Mass production line as well as type Testing. Special fixture can be provided for the specific product. This avoids the connections & disconnections of the product for different tests. The total time for entire testing is less than 40 seconds.
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Charger / Quick Charger / Adapter / LED Driver Test System
6010
6010 Charger / Quick Charger / Adapter / LED Driver Test System is able to meet multi-types power products test requirements，and its multi-U.U.T test simultaneously capability can significantly enhance the production line throughput. It also possess multi-modular combination that includes low noise analog AC source with Triac to simulate output, four sets precision power meter, two or four sets ripple noise / timing measurement module, four sets OVP DC power supply, 3310F series & 3332F/3336F Electronic Load module and unique design 3340F series for LED power driver output test.
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Fully Automated In-line Test System For LED Light Engines
We are pleased to announce that we have received an order for the supply of a fully automated in-line test system for testing LED light engines from ASD Lighting, based in Rotherham. The solution provided, consists of an in-line handler fitted with a vision system. The camera software is capable of learning the position of all LED’s on a new pcb, thereby reducing the time to introduce a new product. In addition to identifying the location of any missing or faulty LED’s the tester measures the colour temperature of every pcb. An image is taken of faulty units with the location of any missing LED’s identified
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
