-
-
product
Temperature Probes
Used for immersion temperature measurement in liquids, air, gas, or wells in solid material, Omega offers a large variety of probe styles in thermocouple, RTD, thermistor, and IC technologies.
-
-
product
Socket Probes
A lot of companies build test sockets. But only our test sockets are populated with our own proprietary probe technology, developed internally. This assures you that when you purchase one of our test sockets, you are using the most advanced interconnect available.
-
product
H.V. Probes
PD-20
Standard Electric Works Co., Ltd
● Measures both AC and DC voltages with digital multitester.● Are typically used to measure high voltages in TV sets, power supplies and instruments in laboratories.● Lightweight and rugged.● 2 available contact tips: round needle tip for normal use and a special flat spring-type for CRT anode.
-
product
Raman Probes
As with Raman spectrometers, a Raman probe is used to measure the inelastic scattering of light from a sample. Raman scattering is produced when the energy levels of photons are shifted up or down as a result of excitation by a monochromatic source (usually a laser). The change in vibrational frequency is used to determine the composition of a target substance.
-
product
Analyzer Probes
The following probes are available for the MA51x0 and MA41x0 series analyzers. These probes are designed for low-voltage and high-speed midbus probing or probing with an interposer. The following JEDEC memory standards are widely used by these probes: DDR5 (JESD79-5), DDR4 (JESD79-4), DDR3 (JESD79-3), LPDDR5 & LPDDR5X (JESD209-5), LPDDR4 & LPDDR4X (JESD209-4), and LPDDR3 (JESD209-3).
-
product
Electrical Resistance Probes
Electrical resistance (ER) corrosion probes are commonly used in petroleum, chemical processing, and other environments where on-line corrosion rate readings are required. Whereas test coupons must be removed from the process for evaluation, corrosion probes can allow corrosion rate determination without probe removal.
-
product
ICT / FCT Probes
*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
-
product
Specialty Probes
Upgraded "bare" versions of our probes for space-saving installation into oil (or SF6) tanks are now available. These probes are similar to the VD series probes with somewhat lower accuracy at a somewhat lower cost. When installing these probes some information about the surrounding areas is required. The length of a VD-120 bare probe (120 kV) is 0.35 m. These units are threaded and can therefore be stacked into higher voltage units. The VD-60 and VD-120 are offered at 60 kV and 120 kV respectively. The bare probes are now available for use in air, but only at 60 and 1120 kV sizes.
-
product
Profile Probes
Consist of several temperature sensing points inside one probe. Used to profile the temperature at various points along a single axis. Great for measuring the temperature distribution in tanks.
-
product
ICT Probes
Merica Serirs- MP175
Minimum Center: 1.91mm (75mil)Current Rating: 3amps, continuousContact Resistance: 40milliohmsMounting Holes Size: 1.35Full Stroke: 6.40mmRated Stroke:4.30mmSpring Force: 203gf (7.2oz)/227gf(8oz)
-
product
Passive Oscilloscope Probes
5900 SERIES
Probe Master's new 5900 series passive oscilloscope probes are available in 400 MHz & 500 MHz bandwidths. Probes are also available with readout actuators for oscilloscopes with the readout feature. The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.The probe body is made of high impact ABS. Soft molded strain reliefs at all stress points assure long cable life. In short it has been designed to offer you high performance coupled with high quality.
-
product
Switch Probes
A switch probe is designed primarily for “presence/ electrical” test applications such as detecting the absence or presence of contacts within a wire harness connector. In this case, the switch probe provides electrical interconnection and verifies the connector has been manufactured properly. If contacts are missing or out of place, the part is rejected. If all the contacts are in place, the part is accepted and an electrical test is performed, verifying the electrical integrity of the connector and the wires within the harness.
-
product
SMD Test Probes
The Parrot Clip, model PCM W1 or PCS-MB W1 invention can be connected to resistance’s, diodes, integrated circuits (SOIC, SO) etcThe advantage of the Parrot Clip is given by the double metal connection made between the new metal tip and the steel hooked rod, spring loaded. This connection, being made by metal parts is electrical and mechanical reliable, even if the contact point are small. Connections are resistant even at high temperatures.
-
product
Test Probes
Our innovative Test Probes are the upgrade version of Auto Multi Meter. It can perform multiple circuit system test such as power supply feed, voltage and resistance measurement, continuity test, ground test, polarity check and components activation.
-
product
Probes, Clamp-On
EM-6981 | 9 KHz – 110 MHz
Current probes enable you to measure conducted current without direct connection to the circuit under test by clamping around the conductor, current carrying wire or structural member being tested.
-
-
product
Rakes and Probes
AEI offers industry leading aerothermal rake and probe design and manufacuring. Aerodyn's unique combination of extensive in-house capabilities and close-knit structure allows challenging and time pressured rake and probe jobs to be handled. AEI welcomes anything from simple make-to-print jobs to elaborate design/fabricate/proof test projects.
-
-
product
ICT/FCT Probes
During in-circuit testing (ICT), each component of an electronic assembly is checked for faults. Short circuits, interruptions, soldering or component faults are detected and assemblies are rejected according to a go/no-go test.During functional testing (FCT), the assemblies are tested completely or in partial areas for the intended operation. The function test of the modules is carried out in the end application or in an environment that simulates the end application.
-
product
Miniature Probes with Cords
Stat MP-1234
This optional probe is used with the Ohm-Stat RT-1000 Standard Resistivity Tester. It accurately measures surface resistivity and conforms to the EOS/ESD 11.11 specifications.
-
product
High Impedance Probes
Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.
-
-
product
High Current Probes
The maximum continuous current rating of a spring probe is determined by its design, size, and construction. Typical probes are rated from 2 to 8 amps maximum continuously current at working travel. While this is sufficient for most board test applications, higher current applications will require a much more solid and rugged probe to withstand current capabilities of 10 to 150 amps and beyond.Another high current solution is our feed-through plunger probe line. As the name already describes, the plunger moves right through the probe and is made from a single piece, reducing the internal resistance of the probe to a minimum.
-
product
Debug Probes
J-Link and J-Trace
SEGGER Microcontroller GmbH & Co. KG
SEGGER J-Links are the most widely used line of debug probes available today. They've been proven for more than 10 years with over 250,000 units sold, including OEM versions and on-board solutions. This popularity stems from the unparalleled performance, extensive feature set, large number of supported CPUs, and compatibility with all popular development environments.
-
product
Resistance & Resistivity Probes
Surface and/or volume resistance measurements are key parameters in describing materials' electrical properties. ETS offers a variety of probes to support numerous industry requirements and applications.
-
product
Spring Probes
Spring probes are designed to optimize performance in high reliability, multicycle applications. Smiths Interconnect's spring probes, featuring IDI contact technology, are compliant which makes them ideal for blind mate applications as they self correct for x, y, z, rotational and angular misalignment of the target. Offered in compressed heights less than 2 mm and utilized on pitches as tight as 0.4 mm, they are well suited for high density, board-to-board, battery contact and high frequency applications.
-
product
ICT Probes
ICT Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
-
product
P2665 General Purpose Probes
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
