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- Pickering Interfaces Inc.
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PXI Single 55x8 Matrix 1-Pole Switching
40-538-021
The 40-538 ultra high density matrix module is configured as a Single 55x8 reed relay matrix with 1-pole switching. Typical applications include signal routing in Functional ATE and data acquisition systems. These PXI matrix modules are constructed using high reliability Sputtered Ruthenium Reed Relays, offering >10e8 operations to give maximum switching confidence with long life and stable contact resistance.
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RELIABILITY BOARD (Reliability Test Board)
The reliability test board is used for testing of HAST, THB, HTOL, BURN-IN, etc. It is a product that evaluates the environmental test and durability when applied to actual products such as lifetime test, high temperature, low temperature, high humidity and thermal shock
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Reliability Testing
ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes and during lifetime (often these defects escape ATE). The improvements to products and processes needed to arrive at zero defects cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.
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Reliability Testing
The reliability test program includes a number of qualification tests based on the type of product, the environment within which it is anticipated to operate in and estimated product weaknesses. Establishing an effective but practical and affordable test program can be a challenge. Reducing the number of units tested or the scope of testing might not yield a sufficient sample of results. Testing multiple units or having an expansive test program can be very time consuming and expensive. A very good resource for establishing a reliability test program is MIL-HDBK-781: Handbook for Reliability Test Methods, Plans and Environments for Engineering, Development, Qualification and Production. This handbook provides test methods, test plans and test environmental profiles which can be used in reliability testing during the development, qualification, and production of systems and equipment.
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Lighting Reliability
LED/OLED package lifetime is highly dependent on thermal management, and LED lamp performance can be dependent on the luminaire in which it is installed. Lighting reliability test system for LED/OLED Products are widely used for normal /accelerated aging, lumen maintenance measuring, lifetime evaluation and temperature characteristic testing for LED/OLED products including LED package, array, module, OLED module and luminaires.
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Reliability Solutions
RT-300
RT-300 is a customizable ecosystem of connected insights, which empower plants and teams to proactively identify maintenance needs, make smarter decisions and keep machine performance and profitability at optimum levels.
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Reliability Testing Services
Innovative Circuits Engineering, inc
Our Reliability Testing Services make it possible for us to work with many different customers who manufacture devices that need tests such as pressure pot, temp cycle and more.The focus of our reliability testing lab is to provide our customers with an array of services and tests that fulfill all of their reliability testing needs. Whether you need preconditioning, thermal shock, pressure pot, or many other reliability testing needs, we are happy to be of service.
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Reliability And Durability Testing
Underwriters Laboratories Inc.
Our reliability and durability testing services provide an accurate assessment of how your product may perform under expected and unusual use. We can help you meet regulatory requirements, gain actionable knowledge about the anticipated life cycle of your products and identify design flaws that have adverse effects on a product’s reliability and durability.
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Product Reliability Testing
NTS performs product reliability hardware testing to ensure that the quality and durability of a given product is consistent with its specifications throughout the product’s intended lifecycle. This testing can be done at both the design and production levels.
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Reliability & Enviromental Testing
NCEE Labs has been providing industry-standard reliability and environmental testing for 20 years. Our experienced testing staff can assist you in determining the type or level of reliability/environmental testing you require for your products!
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Established Reliability & Military Relays
Established Reliability & Military Relays by Teledyne Relay
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Solder Joint Reliability Testing
Solder joint reliability is defined as the ability of your product’s solder joints to function under given conditions and for a specified period of time without exceeding acceptable failure levels.Whether you are trying to implement a new solder type or new component types, solder joint reliability testing is essential in providing confidence that your product will perform within its intended operating limits. The results from different test programs can be compared to provide an understanding of design requirements for adequate reliability. This provides you with useful technical information for future designs, saving you time and money.
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Reliability & Qualification Testing Services
Integra Technologies is an industry leader in providing qualification, design verification and reliability testing services to semiconductor manufacturers and military/space/aerospace and automotive OEMs. Integra offers a full range of qualification services as well as the technical guidance to define a qualification plan that meets your requirements.
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MBP Reliability Module MOSRA - TMI
W8614EP
The W8614EP Model Builder Program (MBP)Reliability Module MOSRA - TMI includes the extraction package for MOS Reliability Analysis (MOSRA) and the TSMC Model Interface (TMI) aging model.
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Combined Environmental Reliability Test System
VTC SERIES
HALT/HASS testing challenges the design, components, sub-assemblies and final assemblies of today's manufactured products. Stresses are applied through a number of conditions to set operational limits and ultimately precipitate failure in the HALT/HASS test environment. Rapid thermal change rate is one of the classic conditions that facilitate product stress.VTC Series chambers are equipped with an LN2 cooling system, with modulating valve and directed air flow to the product, provides the rapid thermal change rates required to achieve maximum product stress. Additionally, these rates are accomplished with smaller space requirements, lower audible noise, no water requirement, and lower maintenance costs than a typical refrigeration system.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Radiation Hardened Solutions and High Reliability Components
Offering a complete portfolio of RadHard and HiRel components, CAES serves as the foundation on which many critical applications are built.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Modular Power Supplies With High Efficiency And High Reliability
UltiMod Series
The industry-proven Excelsys UltiMod power-supply platform combines technical performance with user flexibility. Built for various demanding industries, the series delivers up to 1200 W of output power in a compact 1U form factor and up to 12 isolated output voltages.
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Thin Film Chip Resistors, High Reliability Type
Panasonic Industrial Devices Sales Company of America
An AEC-Q200 Compliant SeriesPanasonic components specified as AEC-Q200 Compliant are consistently designed into automotive systems. However, today’s Design Engineers are specifying AEC-Q200 components to meet the high-quality standards of devices beyond automotive applications.
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Laser Calibration System, Superior Accuracy, Portability and Reliability
5530
The configurable system offers all the components you need to perform a variety of measurements using the USB on your PC as the host controller and power source. For basic linear measurements you will need the USB Axis Module, USB Sensor Hub, Air and Material Sensors, Sensor Cables, Software, Laser, Laser Cable, Remote Control (optional)and the Linear Optics Set. Other available options include the Laser Tripod (with laser mounting plate), optics and fixturing kits for making additional types of measurements, and wheeled transit cases.
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Enabling Low Power, High Reliability, And High Performance Design
Lattice Nexus Platform
The Lattice Nexus FPGA platform combines Lattice’s long-standing low power FPGA expertise with leading 28nm FD-SOI semiconductor manufacturing technology. With this platform, Lattice enables the rapid development of multiple device families that deliver low power, high performance, high reliability and small form factor.
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Thin Film Chip Resistors, High Stability and Reliability Type
ERA-XV/ERA-XK Series
Panasonic Industrial Devices Sales Company of America
Anti-Sulfurated Thin Film Chip Resistors From Panasonic For Dependable, Accurate And Reliable Performance In Extremely Hazardous EnvironmentsPanasonic's ERA-xV and ERA-xK Series Thin Film Chip Resistors feature a soft terminal and passivated layer. With a total of 2,889 part number variants, Panasonic ERA-xV and ERA-xK Series Resistors provide design engineers with a wide array of Resistors to choose from specifically developed to handle extremely hazardous and challenging application environments.
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Laser Diode Burn-In Testing
Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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HALT HASS Chamber
Guangdong ALI Testing Equipment Co,. Ltd
HALT HASS Chamber are types of equipment used to test the reliability and life span of all kinds of products,simulation,specifically to provide the industry with accelerated reliability testing capability.
