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Product
Reflective Memory
VME-5565
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The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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Product
Volatile Memory
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CAES offers an extensive volatile memory portfolio developed to handle the demands of harsh space and terrestrial environments.
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Product
Memory
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Renesas is renowned for its product lifetimes, and our memory products are no different. Our wide range of low power SRAM products provide high reliability, stable supply and long lifetime support often not found in these devices, making them ideal for industrial designs. Renesas’ ultra-fast QDR™ (Quad Data Rate) SRAMs are ideal for next-generation high bandwidth communication systems that require memories capable of very high operating frequencies combined with low latencies and full cycle utilization. Our EEPROM realizes high speed, low power consumption and a high level of reliability by employing advanced MONOS memory technology, a CMOS process and low voltage circuitry technology.
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Product
Memory Tester
RAMCHECK
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RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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Product
Memory Test System
T5835
Test System
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Memory And Storage
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Intel provides technically advanced products that support every level of computing—from data center workloads to enthusiast usage. Intel® Optane™ memory creates an accelerated bridge between memory and storage. Intel® Solid State Drives (Intel® SSDs) provide storage flexibility, stability, and efficiency.
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Product
Memory Testing
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C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Memory Burn-In Test
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The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Performance Profiler / Memory Leak Detector
GlowCode
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GlowCode is a complete real-time performance and memory profiler for Windows and .NET programmers who develop applications with C++, C#, or any .NET Framework-compliant language. GlowCode helps programmers optimize application performance, with tools to detect memory leaks and resource flaws, isolate performance bottlenecks, profile and tune code, trace real-time program execution, ensure code coverage, isolate boxing errors, identify excessive memory usage, and find hyperactive and loitering objects.
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Product
DDR4 Pro Memory Test Adapter
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This memory test adapter for the RAMCHECK LX includes an extraordinarily rugged test socket for many thousands of insertion/removal cycles.
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Product
RAMCHECK LX DDR4 Memory Tester
INN-8686-DDR4
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The RAMCHECK LX DDR4 quickly and accurately tests and identifies DDR4 DIMMs for servers and desktops, as well as laptop SODIMMs.
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Product
Reflective Memory
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An innovative solution designed to provide highly deterministic data communications for your real time applications such as distributed simulation.
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Product
Reflective Memory Node Card
PMC-5565PIORC
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The PMC-5565PIORC Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data.
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Product
Shared Memory Network XMC Interface
XMC-SMN
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Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
Acute 2GHz, 34 Channel, TravelLogic Series Protocol & Logic Analyzer With 8Gb Memory
Acute TL4234B
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The TravelLogic Series of Protocol & Logic Analyzers are small enough to fit into your shirt pocket, yet are truly sophisticated logic analyzers, capable of 2 GHz timing analysis, or 200 MHz state analysis, with up to 8 Gb total stackable memory for the 34 channels. They plug into a PC or Laptop USB port making them ideal for the field service technician or engineer, hopping from PC to PC, or taking with them for diagnosis on the road. Also remember that with USB, no additional power supply is needed.
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Product
Keysight 4-Channel D/A Converter with Waveform Memory for 34980A
34951A
Digital / Analog Converter
The Keysight 34951A module for the 34980A Multifunction Switch/Measure Unit has four electronically calibrated analog channels that can output up to +/-16V DC or +/-20mA DC with 16 bits of resolution. Each channel can be updated individually with a 200 kHz update rate. You can use the standard waveforms provided or create your own with over 500,000 points. These points can be dynamically allocated among one or more channels and output as a point-to-point arb.
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Product
Memory Burn-In Tester
H5620/H5620ES
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As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Product
Fast 8 Bit PCIe Gen-2 Digitizer With 1x2 GS/s, 2x1 GS/s, 16GS Memory
Cobra Express 22G8
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The Cobra CompuScope family of high-speed 8-bit digitizers provide a powerful combination of speed, memory, and bandwidth as well as a wide portfolio of advanced acquisition features on a single PCI Express or PCI card.
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Product
IP-Reflective Memory
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Each IP-ReflectiveMemory can be used as a standard node or as the Master Node. Clearly labled "DIP Switches" are provided to make the selection of Master or Standard Node, and the Node Address. The Network is based on using LVDS signaling over Ethernet cabling. Nodes automatically come up for pass through operation.
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Product
Lan Ethernet Digitizer, 14 Bit, 8 Channel 125 MS/s Up To 8 GS Memory
Octopus-X
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The GaGe series of Faceless Connected Instruments (FCiX) provide test and measurement professionals new options for integrating high resolution, multi-channel digitizers into Ethernet and LAN enabled measurement systems. The applications served include manufacturing test, automotive test, remote communications monitoring, multi-site semiconductor test, and other solutions where a lightweight but powerful, multi-channel, independent digitizer system is required.
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Product
16 Bit PXIe Gen-3 Digitizer With 4 Channels 1 GS/s And 4GS Memory
RazorMax / CSX 161G4
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The new extremely fast and high-resolution Gage digitizers of the series RazorMax Express CompuScope offer with a 3U Single slot PXI Express card a resolution of 16 bit and a sampling rate of 1 GS/s (per channel).
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Product
14 Bit PCIe Gen-2 Digitizer 2 Channels 200 MS/s Up To 8 GS Memory
Razor-14 / CompuScope 1442
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The GaGe RazorTM family of multi-channel digitizers features up to 4 channels in a single-slot PCI Express or PCI card with up to 200 MS/s sampling per channel, and up to 8 GS of on-board acquisition memory. Combine several Razor cards for up to 32 channels in a single system.
