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- Applied Rigaku Technologies, Inc
product
Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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FAST SDD and C2 Window
EDS (SEM) Applications
Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
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Silicon Drift Detector
Octane Elite (SDD) Series
The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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Energy Dispersive Spectroscopy (EDS) Detector Technology
EDS
The Element SDD is a solutions based detector, which excels at basic analysis. Focused primarily on serving the needs of the industrial market segment, it provides application specific software and analysis that can quickly provide answers in the industrial environment.
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Bias Boards
CUBE
The CUBE Bias Boards are a set of off-the-shelf biasing boards developed to speed-up the integration process of the CUBE CMOS preamplifier family of XGLab. These boards allow to bias both the detector (SDD as standard, other detector upon request) and the CUBE preamplifier.
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Portable EDXRF Analyzer
ElvaX Mobile
ElvaX Mobile is a portable EDXRF analyzer for testing all kinds of materials. Sampling tray as in a benchtop instrument allows for convenient placement of x-cells. High resolution SDD detector and the absence of collimators ensure high count rate, which is crucial for quick detection of trace elements.
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Energy Dispersive Spectroscopy (EDS) Platform
Octane Elect EDS System
The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage (kV) microanalysis.
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Micro-XRF spectrometer
Atlas™
The Atlas™ Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (10µ) available on the market. Additionally, the Atlas™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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XRF
L Series
The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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X-Ray Fluorescence Analyzer
MESA-50
HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
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Robust DIN-rail Fanless Embedded System With Intel® Celeron® Processor N3060/N3160, 2 COM, 4 USB, 2 GbE LAN (1 PoE PD), DIO And RTC
ICO310
The ICO310, a robust din-rail IIoT (Industrial IoT) embedded platform, supports low power Braswell Intel® Celeron® processor N3060 1.6 GHz dual-core or N3160 1.6 GHz quad-core with up to 8GB DDR3L system memory, delivering high performance and low power consumption at competitive price. The outstanding Braswell Intel® Celeron® SoC-based embedded field controller offers complete expandability and full featured I/O, including two Gigabit LAN ports, two RS-232/422/485 ports, two USB 2.0 ports, two USB 3.0 ports, one VGA port, and one DIO interface. Two PCI Express Mini Card slots, one SIM card slot and three internal antennas are available for 3G/GPRS and Wi-Fi connections. Furthermore, the ICO310 features PoE PD function, which can simplify network installation and minimize the total costs of replacement and maintenance. Its storage interfaces include an SATA SDD, as well as mSATA support on the PCI Express Mini Card slot. Additionally, the wide range 12V-24V DC terminal block power input with overvoltage and reverse protection can lower the risk of data loss under human manipulation. The reliable yet robust ICO310 is a perfect solution for industrial IoT applications such as smart energy, smart factory automation, facility monitoring systems and many more.