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Switch Test
Make, break, or change the connection of a circuit.
- Pickering Interfaces Inc.
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PCI Fault Insertion Switch Range for Differential Serial Interfaces
50-200/201
Pickering Interfaces, a leading supplier of modular signal switching for electronic test and simulation, is expanding its range of PCI Fault Insertion switching with the introduction of two new modules (models 50-200 and 50-201) designed for use with differential serial interfaces. PCI Fault Insertion Switch Cards for Differential Serial InterfacesThe new modules include the Differential PCI Fault Insertion Switch (model 50-200) which is designed for lower data rate serial interfaces such as CAN and FlexRay, and the High Bandwidth Differential PCI Fault Insertion Switch (model 50-201) which is designed for higher data rate serial interfaces such as AFDX and 1000BaseT Ethernet. Each module allows the introduction of fault connections that include data paths open, data paths shorted together, and data paths shorted to externally applied faults such as power supplies and ground. The software driver defaults to a protective mode where conflicting faults are prevented to avoid accidentally shorting unintended paths, such as power to ground. A separate mode allows complete freedom in setting fault patterns.
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Test Switch
The W3TS Test Switch, a miniature knife blade switch (5/8 inch centers including barrier) with #10-32 stud terminals, is available in three types: Basic Switch, Short-Circuiting Switch (Shorting Switch), Test Jack Switch
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Digital Test Switch
FT-14D
Test switch solution for digital switchgear using current and voltage sensors. With the FT-14D Digital FlexitestTM switches, a new era of protection relay testing can be performed more safely, quickly and easily. The FT-14D switch allows a customer to integrate current and voltage sensors within digital switchgear and protective relays and thereby enable the Industrial Internet of Things.
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7-Pole Test Switch Protectors
6442 & 6442-C
With safety always being a concern while working with electrical boxes, you can depend on TESCO’s Test Switch Protectors (Catalog No. 6442 & 6442-C) to alleviate any uncertainty. This was developed to provide temporary protection of the test switch and to address the rising concern that the terminals of the test switch are exposed while you’re working in the box. The switch protector can prevent incidental contact with live terminals or contact with tools. TESCO’s Test Switch Protectors are constructed of clear, flexible PVC with a voltage rating of 2500V. The switch protector will fit any brand of test switch, regardless of manufacturer, from 4 to 7-pole. TESCO can also develop custom designs of this product to meet unusual test switch configurations.
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10-Pole Test Switch Protectors
6441 & 6441-C
With safety always being a concern while working with electrical boxes, you can depend on TESCO’s Test Switch Protectors (Catalog No. 6441 & 6441-C) to alleviate any uncertainty. This was developed to provide temporary protection of the test switch and to address the rising concern that the terminals of the test switch are exposed while you’re working in the box. The switch protector can prevent incidental contact with live terminals or contact with tools. TESCO’s Test Switch Protectors are constructed of clear, flexible PVC with a voltage rating of 2500V. The switch protector will fit any brand of test switch, regardless of manufacturer, from 4 to 10-pole. TESCO can also develop custom designs of this product to meet unusual test switch configurations.
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Amplifier, Switch and Test Box
CLIOQC Model V
The QCBOX Model 5 is a non-conventional unit designed to fulfil actual and future needs of an electro-acoustical analyzer like the CLIO system. It is USB linked to a PC and can be configured, with dedicated software controls, to assist frequency response and impedance measurements or to perform DC measurements. Using it for frequency response measurements acts as 50W power amplifier to drive the speaker or network under test while routing one-of-four inputs to the analyzer as well the current sensing output. The four inputs are able to provide a phantom power supply both for Audiomatica or general purpose microphones (0-24 V range, software controlled). Impedance measurements can be done either switching the D.U.T.’s load across the analyzer’s input or using a dedicated output, ISENSE, thus allowing impedance measurements in constant voltage mode as well voice coil current distortion analysis. An internal ADC measures the DC current into the voice coil. Thanks to an internal software controlled voltage generator the speaker can be driven with a superimposed DC voltage (±20V), allowing for measurements of large signal parameters. Two ADC converters with a ±2.5 V and ±5 V are available at inputs 3 and 4 to measure the displacement with a laser sensor or any other DC signal. A dedicated digital input handles an external foot pedal switch (or TTL signal) to be connected and triggers QC operations. A 6 bit output – 5 bit input TTL digital port is available to interface the QCBOX and driving software with external hardware (like turntables for example).The QCBOX Model 5 finds use both in laboratory for R&D applications and in production lines setups.
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Switch Stick Test Equipment
Hanco units provide a full high voltage electrical test as required by OSHA. Front-loading, top-loading and portable units are available.- Sticks can be tested wet or dry.- Test units are available to test sticks up to 14 or 21 feet maximum length or up to 8 feet for the portable unit.
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HV Switch Test Equipment
KV Hipot Power Test Equipment Co.,Ltd
High Voltage testing is usually performed to qualify the device to operate safely during rated electrical conditions, a way to check the effectiveness of its insulation. The objective sought during the high voltage testing will determine the type and amount of voltage applied and the acceptable current flow.
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Automated Switch Test Equipment
TRICOR Systems Inc. offers test equipment for switches, keypads, rubber, etc. Virtually any component where accurate force-displacement and measurements are required. From our Model 933A, a low cost life test system to our Model 925 test station used to obtain precise force measurements relative to displacement; we have the system you require.
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Circuit Breaker (Switch) Test Instruments
Wuhan Huatian Electric Power Automation Co., Ltd.
Circuit Breaker (Switch) Test Instruments by HVTEST
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Inducitive Switch Transient Test Circuit
NSG 5071
The basic philosophy of this test circuit is better reproducibility of actual switching transients. The reproducibility of this test circuit comes not from the output characteristics as in traditional conducted automotive immunity tests, but from a fixed design of the generator using several pre-defined components. Many of these components are defined in the standard as "critical" with no substitutions allowed. These components are used as required in the standard.
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40N Switch Tester Coupling Implement Shell Pressure Test Device
CX-F01
Shenzhen Chuangxin Instruments Co., Ltd.
This device is according to the IEC60320-1 standard requirement to design. Appliance inlets designed for surface mounting and having a shroud of metal, are compressed in an appropriate test apparatus, an example of which is shown in figure 20. The spherical end of the jaws shall have a radius of 20mm±1mm. A force of 40N±2N shall be applied for 60s±6s through the jaws to the most unfavourable point half-way up the outer surface of the shroud, in a direction perpendicular to the axis of the shroud. After the test, there shall be no deformation or loosening of the shroud such as will impair the further use of the appliance inlet.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
