IC/BGA Tester

Focus-2005 - Kyoritsu Testsystem Co., Ltd.

As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.
As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)
Short/Open checker for semiconductor sensor device.

It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. （auto measurement）
Only device can be measured. It is also possible to fabricate the test fixture.
Various devices can be measured by replacing the socket board.
It is no need to generate complex test programs as reference values are calculated from good device.
It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)