Advanced Metrology System
AMS Series - QES Mechatronic Sdn Bhd (QES)
Precision systems for accurate measurement and quality control in semiconductor manufacturing.
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product
Wafer Thickness Measurement System
MPT1000
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
