FETservice, Inc
Our team has over two decades' experience producing and servicing high-quality test systems for discrete semiconductors. Our systems address a complete range of semiconductor devices.
- (408) 988-8101
- info@fetservice.com
- 402 Martin Ave.
Santa Clara, CA 95051
United States
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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product
Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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product
Handler/Prober Interfaces
IFXX
FETtest offers a variety of Interface options, which expand test capability and provide connection to other production line resources. These interfaces range in complexity from simple handler/prober interfaces to interfaces with user programmable external component connections, to capacitance measurement systems. Models are available to work with the full range of FETtest systems and Remote Stations.
