Hinds Instruments, Inc.
Hinds Instruments, Inc. is a world leader in developing and supplying polarization measurement technology for a broad range of applications. With 40+ years of polarization modulation experience, Hinds Instruments solutions are proven tools for research applications as well as metrology in the lab or fab. Hinds’ family of products includes modulators, Stokes polarimeters, Mueller matrix polarimeters, MOKE measurement systems and Exicor® birefringence measurement systems.
- 800.688.4463
503.690.2000 - 7245 NW Evergreen Parkway
Hillsboro,, OR 97124
United States
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High Speed Optical Choppers
The Optical Choppers offered by Hinds Instruments are resonant devices designed to work at one frequency. We offer two ways to chop light: a High Speed Optical Chopper (HSOC) and a Photoelastic Modulator (or PEM).
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Lock-in Amplifier
Signaloc
Designed for use in Hinds’ Exicor Systems the Signaloc is now availaible for anyone who can use a dual-phase, analog, single frequency lock-in amplifier.
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MicroImagerTM
Exicor®
The Hinds Birefringence Imaging Microscope is ideal for measuring birefringence in biological structures, glass, crystals, and many other organic and inorganic samples.
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Amplified Photodetectors
Hinds Instruments' photodetector modules are specifically designed for use with high frequency optical signals including those generated in Photoelastic Modulator (PEM) applications.
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Birefringence Measurement Technology
Hinds Instruments Birefringence Measurement technology has been adopted by industry leaders world wide to measure birefringence and characterize stress birefringence in materials with unsurpassed accuracy, resolution and repeatability. Capable of measuring optical retardation at 0.001nm resolution with noise floors as low as 0.005nm, these systems are robust, dynamic and scalable to fit the demanding requirements of your application. We provide measurement systems across the light spectrum (DUV, VIS and NIR) and are able to measure virtually all optical materials.
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2-MGEM Optical Anisotropy Factor Measurement System
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Complete Solutions
The photoelastic modulator provides unparalleled sensitivity in both polarization generation and polarization measurements. However, there are many non-PEM components in most polarization experiments that can adversely affect your results. The proper selection of detectors, demodulators, light sources and polarizers is crucial to obtaining the quality results that you need and that the PEM makes possible.
