Amida Technology, Inc.
AMIDA Technology Co., Ltd., which focuses on "semiconductor test equipment and system technology development", has a technical team with rich experience in instrument and system design, as well as excellent marketing and customer service enthusiasm , to provide its customers with the best testing solutions. In addition to the high-quality analog IC testing machine developed by Meida Technology, it is also developing towards the "mixed signal measurement" block. Its system functions are in the same level of equipment, except for the relatively wider testing range, high stability, and testing. In addition to its fast speed and strong ability to measure and measure, its system has a very advantageous price, so it is deeply praised and recognized by domestic and foreign customers.
- +886-2-8227-3822
- +886-2-8227-3818
- info@amidatec.com
- 15th Floor, No. 268, Liancheng Road
Zhonghe District(Building J, Far East Century Park)
New Taipei City,
Taiwan
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Time Measurement Unit
TMU
TMU is a dual-channel input and ARM input PCI-based time interval counter (Time Interval Counter) . The internal 40 - bit counter provides a series of precise measurements, including frequency, period, time interval, pulse width, and more. TMU uses a reciprocal counting technique , which enables low-frequency signal measurement, taking into account both measurement accuracy and measurement time. The generator creates and generates many versatile waveforms. The following are the outstanding features of the CT-50 .
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AMIDA VCSEL Tester
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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AMIDA IGBT Tester
600
KVI Source: 1 Channel 4Q V/I Source; ±1000V, ±10mA Source ability; V/I read back at 16 bits resolutions under 100Ks sampling rate ; ±0.2% accurate reading of Range
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AMIDA IPM Tester
3001XP
HVI Source:16 Channels 4Q V/I Source; Two zero ref. floating GND ; ±30V, ±200mA Source ability; V/I read back at 16 bits resolutions under 100Ks sampling rate ; ±0.2% Accurate reading of Range
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Arbitrary Waveform Generator
AWG-50
The AWG-50 instrument is a single-channel PCI-based Arbitrary Waveform Generator (AWG) with a built-in Digitizer. It is a high-performance waveform generator that combines multiple powerful functions in a small package. With a waveform update rate of 50MS per second, each channel has up to 4M bytes (16M bytes optional) of waveform memory, you can use the additional waveform editor to create and generate many versatile waveforms. The following are the outstanding features of the AWG-50.
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AMIDA 3KS Tester
The AMIDA-3KS test system provides a lower cost, cost-optimized test solution for all consumer power management ICs and portable product components. The AMIDA-3KS tester provides 6 board slots in the test head for the required number of analog board channels, thus reducing the overall system procurement cost, making the cost-effectiveness of each board channel 2 times higher and more flexible. The customer's product testing time is greatly shortened.
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AMIDA ATI 600 Tester
AMIDA ATI 600 Tester is a dedicated test system for semiconductor components (MOSFET, BJT, DIODE, ... etc.), which can accurately and quickly measure product parameters through form filling and editable program control. In practical applications, AMIDA ATI 600 Tester is the best choice for users, whether it is CP or FT mass production testing, or research projects of component characteristics.
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AMIDA 2020XP Tester
AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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AMIDA 5000 Tester
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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GPIB General Purpose Interface Bus
The design of the GPIB control card is fully compatible with the IEEE 488.1 and IEEE 488.2 standards, using the PCI interface, supporting the Plug & Play specification, and supporting Windows 95/98/Me /NT4.0/ 2000 /XP/7 Operating system, driver function library includes Windows development software tools such as Visual C++, Borland C++ Builder, Labwindows, Visual Basic, Delphi and Labview. This GPIB-supported library provides an NI-like command control syntax format, which is convenient for users to develop and transfer applications smoothly. This interface card also provides a conversational window GPIB interface program, which is convenient for users to directly control the instrument without writing a program.
