Lorlin Test Systems
Lorlin Test Systems® manufactures and distributes discrete semiconductor component test systems that run under an Intel® based Windows 10® 64-BIT Operating System with a USB 2.0 tester interface.
- 631-392-1385
- 631-940-8456
- sales@lorlin.com
- 87 E Jefryn Blvd
Deer Park, NY 11729
United States
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The Lorlin© Impact Series
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Upgrades and Parts
The Lorlin Test Systems Impact Testing Software Upgrade Version 7+® operates under Windows 7/8/10® 64-BIT with a USB 2.0 tester interface is available for Impact and Dataspec Testers.
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Impact Series Power Discrete Semiconductor Tester
The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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Rebuilt Testers
Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
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Benchtop Discrete Component Tester
Imapact 7BT
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
